| 1. | The depth resolution of that technique ( about 50 nm ) , however , is not sufficient
在非损伤技术中，卢瑟福背散射是使用最广泛的技术之一。 |
| 2. | A depth resolution of nano - meter level was achieved to light elements such as c and h with the q3d spectrometer system
用100mev的127i束对c / lif多层样品分析结果表明，表面分辩达到了1 . 2纳米。 |
| 3. | As proved by experiments , combined the method of averaged in the plane and dynamic image capture , the depth resolution can be double improved
该方法采用方向性和择优原则，不仅可以消除毛刺，而且具有很强的智能连断功能。 |
| 4. | Two methods of reducing the speckle noise and improving the depth resolution in optical 3d profilometry with laser sheet are proposed in the paper
本文提出了两种激光片光三维传感中减小激光散斑影响，提高深度分辨率的办法。 |
| 5. | Surface chemical analysis - secondary - ion mass spectrometry - method for estimating depth resolution parameters with multiple delta - layer reference materials
表面化学分析.次级离子质谱法.多层标准材料深度溶解参数的估算方法 |
| 6. | Among the destructive techniques able to provide the desired depth resolution the most widely used technique is secondary - ion - mass spectroscopy ( sims )
在可以提供所希望的纵向分辨率的损伤技术中，最广泛运用的是二次离子质谱（ sims ） 。 |
| 7. | The depth profiling of the elements from light to medium could be simultaneously obtained by the ae - e telescope detector with a depth resolution about 20 ~ 30 nm
用e ? e望远镜探测器同时地得到靶材料上从轻至中重各种元素的深度分布，其深度分辨达20 30nm 。 |
| 8. | In this article we present an easily implemented ( destructive ) method that is able to provide the ge concentration of the sige alloy at the desired depth resolution
本文提供了一种简单的执行（损伤的）方法，它可以在期望的纵向分辨率下得到锗硅合金的锗浓度。 |
| 9. | Discharge conditions at which depth profile analysis of tinplate had good depth resolution were selected by researching spectrometric behaviors of tinplate at different discharge conditions
摘要通过研究不同放电条件下镀锡钢板的光谱行为，确定了具有较好深度分辨率的放电条件，建立了镀锡钢板的辉光放电发射光谱定量深度分析方法。 |
| 10. | Discussed the optical imaging principle of laser confocal scanning microscopic imaging system whose important character is high plane resolution and high depth resolution . analyzed the controlling technique of scanning imaging . according to the different needs for laser confocal scanning microscopy and gene - chip scanner , two kinds of scanning methods , optics scanning and object scanning , are presented
讨论了激光共聚焦扫描显微成像系统的光学原理及其成像的重要特点，即激光共聚焦扫描显微成像系统不仅具有高的平面分辨率而且具有很高的深度分辨率；分析了系统的扫描成像控制技术，根据激光共聚焦扫描显微镜系统和基因芯片扫描仪的不同需要提出了两种扫描方式，即光学扫描方式和物体扫描方式，指出了两种扫描方式的优缺点，并对各自的成像非线性畸变问题进行了探讨，提出了解决方案。 |
